Precision Michelson-type interferometer for relative angle measurements

Artifact Number:

2018-077

Description

This was a precision, computer-controlled, Michelson-type interferometer used to measure the important physics parameter, the fine structure constant.  The device could make diffraction angle measurements within an accuracy of +/- 0.005”.  To maintain the physical dimensions accurately all critical parts of the apparatus, which measures ~60 cm in width, were machined out of Invar, which has an almost zero expansion coefficient over a wide temperature range.  The apparatus was designed and assembled at CRNL by H. Bird as a PhD thesis project and was used for a number of years for measuring X and gamma ray scattering precisely by J. W. Knowles and his experimental group. 

 Overall computer control was achieved with a PDP-8 computer.  During measurements there were a number of delicate and complex optical lenses and mirrors used.  Unfortunately most of these were badly damaged over the years of storage.

Details

Keywords:
x-ray spectroscopy; michelson interferometer
Materials:
Invar
Date:
1968
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